Paper title


Developing Fast Memory Test



страница5/6
Дата18.05.2022
Размер79.5 Kb.
#114342
1   2   3   4   5   6
An approach for Testing memory

Developing Fast Memory Test


The memory is one of the most critical resources in any electronic system. During product manufacturing there is a need for memory testing. One type of memory problem usually is caused by physical or electrical damage to the memory chip during manufacture. Another type of problem is the circuit board. Typical circuit board problems are problems with the wiring between the processor and memory device, missing memory chips, and improperly installed memory components. Three individual memory tests are able to detect these kind of problems: a data bus test, an address bus test, and a device test. The device test has to be run after successful completion of data and address bus tests.
For testing program memory here are used the industry recognised March C and March X algorithms [6]. These tests consist of a finite sequence of March elements, while a March element is a finite sequence of operations applied to every cell in the memory array before proceeding to the next cell. In general the more March elements the algorithm consists of the better will be its fault coverage but at the expense of a slower execution time.

Tab 1. Source code test description.



Declaration

SetMemory((unsigned char*)&Field[0], 1024, 0x55);
Counter1 = 0;
CompareMemory((unsigned charField[0], 1024, 0x55)
SetMemory((unsigned char*)Field[0], 1024, 0xAA);
Counter2 = 0;
CompareMemory((unsigned char*)&Field[0], 1024, 0xAA)

Description

FLASH memory test using upgraded March X algorithm

Input Parameters

Field[0[

Block size of the array of bytes of FLASH to be tested

Const

Fill constant set to memory for test

Output Parameters

Counter1

Counter of h’55s

Counter2

Counter of h’AAs

The proposed algorithm has been created from a standard March X algorithm and it is byte oriented memory version. The developed algorithm uses four elements:




  • Starting at the lowest address, write h’55s, increment up array byte by byte.

  • Read all h’55s from array and write the value in int Counter1.

  • Read all h’AAs from array and write the value in int Counter2.

The source code TestFLASH.c is written in ANSI C and compiled with IDE IAR EW 5.23 for MCU MSP430x family (table 1). This algorithm is faster than March C and March X algorithms and could be used for testing RAM memory also. The period of testing is eight times less than the standard March C and March X algorithms and two times faster than byte oriented memory version of March X algorithm.




  1. Сподели с приятели:
1   2   3   4   5   6




©obuch.info 2024
отнасят до администрацията

    Начална страница