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AN APPROACH FOR TESTING COMPUTER MEMORIES МЕТОД ЗА ТЕСТВАНЕ НА КОМПЮТЪРНИ ПАМЕТИ Eng. Roumen Bagalev, PhD student, Technical Faculty, Department of EEA, South-West University, Blagoevgrad, email: r.bagalev@abv.bg Инж. Румен Багалев, докторант, Технически факултет, катедра ЕЕА, Югозападен Университет, Благоевград, email: r.bagalev@abv.bg Assoc. prof. Lyudmila Taneva Technical Faculty, Department of EEA, South-West University, Blagoevgrad, email: lucy_t@swu.bg Доцент д-р инж.Людмила Танева, Технически факултет, катедра ЕЕА, Югозападен Университет, Благоевград, емeйл: lucy_t@swu.bg Abstract: The paper describes an approach for testing computer memories. The suggested method can reduce the duration of other tests and overall test cycle. Testing of the printed circuit boards and final products is vital part of the electronics manufacturing process. In this paper we will overview some of the most widely used tests in electronics manufacturing, their purpose and specifics and will outline the most important elements of the test strategy – structural tests and functional tests. The structural tests check the structure of the PCB/PCBA for open or short circuits; the quality of the solder joints; component presence and orientation etc. The functional tests validate the functionality of the devices and their performance. Keywords: test strategy, PCB, structural tests, functional tests INTRODUCTIONThe costs of the test could be one of the major costs of manufacturing a product and at high volume production it will have a huge impact. For this reason the test strategy must be chosen very carefully. The test strategy determines what tests and where in the manufacturing process to be used. The type of tests and the respective test equipment depend on many factors and the majority of them are directly related to the manufactured pro-duct itself. The technique of product design that adds certain testability features is known as Design For Test (DFT). Sometimes DFT stands for Design For Testability [3], which is the same. Well designed, with testability in mind products, provide easy and convenient access to the circuits and the test points and allow the use of the most efficient for this particular board test methodologies. Decisions about the way the sub-assemblies are tested must be taken as early as at the design stage to ensure that the optimum fault coverage is achieved for the lowest cost [5]. In this paper we will overview some of the most widely used tests in electronics manufacturing, their purpose and specifics and will outline the most important elements of the test strategy. Here are presented some fast algorithms for memory test, developed for MSP430 devices. Изтегляне 79.5 Kb. Сподели с приятели:
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