Системен подход, управление на процеси и методи и средства за подобряване на процесите

Power Supply 1 and 2 1.2 - 24 V, 3 A
Current measurement Resolution 1 mA 0 - 3 A
2 Fixed Power Supplies 5 V, 0.5 A / 28 V, 0.75 A
16 Analog Inputs 0 - 24 V, 5.9 mV resolution
16 Analog Outputs 0 - 24 V, 5.9 mV resolution
24 Digital Inputs with Schmitt
Trigger
1 frequency measurement/pulse counter 0 - 24 V
4 pulse width/pulse counters 0 - 24 V
52 Digital Outputs
(20 bi-directional)
3 groups of 8 bits with programmable logic ‘1’ level
1.5 - 24 V
4 ‘High-Side’ power outputs with programmable output voltage
5.5 - 24 V
24 open collector outputs, capable of driving relays
2 PWM Outputs 5 V, 0 - 1 MHz,
0 - 100% Duty Cycle
I2C Interface
SPI extension interface Additional in- and outputs
1 Serial Channel UART 5 V
1 In-Circuit programmer For microcontrollers
SPI interface 78 kHz
CAN 2-wire, 1-wire
3 Ethernet Module, Expansion Board, Backside 10/100 Mbits/s
4 USB over Ethernet Module, Expansion Board, 2 Backside 2.0
High Speed supported
Current measurement Resolution 1 mA 0 - 3 A

- FPT

DRIVE TECHNOLOGY AND MECHANICS
(INCL. OPTIONS)
Breakthrough 4 heads & 6 flying probes system
Ultra-fast XYZ motors and controls
50% faster than conventional Flying Probe Tester
25% more accurate, minimum pad size of 60µm
New design of the XY axis and the XY table made of granite
Flexible robotic cables for long-standing measurement
Advanced soft touch control
Measuring circuits mounted on the flying heads

Newly developed flexible board clamping mechanism
Conveyor system with automatic width adjustment and SMEMA interface
MEASURING UNIT (INCL. OPTIONS)
16 Bit DAC/ADC measurement unit incl. 3 x DC 4-quadrant power supplies
R, L, C measurement
Kelvin measurement
Guard function
Diodes & Zener diodes measurement
Transistors/FET/Optocouplers/Relays/etc.
Voltage regulators/Operational amplifiers/Transformers
DC/AC current and voltage measurement
Characteristic measurements of components and circuits
Isolation Tests
Continuity test
Frequency measurements
AC signal generator
Cluster tests
IC Open sensor
LED Sensor (color and brightness)
Net Signal Wave function
Integration of external power supplies and test equipment
(Boundary Scan, In System Programming, etc.)
OPTICAL SYSTEM (INCL. OPTIONS)
High Density CCD color camera
2 x Programmable LED ring illumination
Fiducial mark recognition (correction of position, inclination, elastic deformation)
Simple vision test (reverse polarity, absent, incorrect component)
1D and 2 D barcode recognition
Color recognition
Color Real Map function for graphical display of circuit board and contact points

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